Videos
Videos
Shaping the Future of Autonomous Driving
Jamil Mazzawi interview for EDACafe: Optima CEO is talking about it’s new high-performance pre-silicon HW security solution, Optima-SEC
Nowadays, there is no equivalent to Optima-SEC in the EDA market. Most companies do post-silicon fault attack simulation, which is extremely costly and time-consuming. While Optima’s solution:
- verifies the attack-protection mechanism implemented in the chip that protects its secret information against laser attacks or EM radiation attacks;
- detects trojan inserted into the hardware which attacks the chip post-manufacturing;
- performs millions of fault attack simulations at RTL or Gate-level before tape-out without paying the costs of expensive labs and post-silicon bug fixes.
DVCon US’2021 Workshop: Achieving ISO 26262 ASIL Metrics Using Modern Static And Dynamic Failure Mode Fault Analysis
Automotive Functional Safety Analysis under the ISO 26262 standard has evolved over the last few years, as the challenges have become better understood and respective solutions refined. Early approaches to demonstrate that devices meet specific Automotive Safety Integrity Level (ASIL) requirements have given way to more effective techniques and technologies. In this workshop we present new solutions that accelerate and increase the accuracy of this development phase.
Presented at: DVCon US 2021, Online Tutorial, March 1, 2021
By: Sesha Sai Kumar C.V., Optima’s Director of Application Engineering
Read more HERE.
DVCon EU’2020 Tutorial: Meet ISO26262 FuSa Targets Through Static & Dynamic Fault Analysis
Meeting today’s Functional Safety Targets is posing new challenges for design teams working on automotive and other safety-critical chips at all, ASIL-A to -D, risk levels.
Even the parts of the design with the lowest ASIL A and B safety goals need some level of analysis, such as sizing different failure modes and making sure the implemented safety mechanisms at least has reasonable coverage potential.
Presented at: DVCon Europe 2020, Online Tutorial, October 27, 2020
By: Sesha Sai Kumar C.V., Optima’s Director of Application Engineering
Ansys-Optima webinar: Functional Safety for Semiconductors in Critical Autonomous driving systems
In this webinar, Optima, and Ansys showcase their collaboration around the combined solution for Functional Safety using the Optima Safety Platform and Ansys’ Medini Analyze. This solution provides the best of two words, Ansys’s best-in-class Functional Safety management platform with Optima’s best solutions for ASIL-A and ASIL-B fault-sizing solutions and ASIL-C and Ad ASIL-D fault simulations solutions for both Permanent-faults (Hard Errors) and Transient-Errors (Soft-Errors).
Presented at: Online Webinar, 13 May 2020
By: Nael Qudsi, former Optima Director Engineering, & Dr. Eckhardt Holz, Ansys Manager Safety Expert Team.
DVCon Europe 2019 – Panel: Automotive Specific, Next-Generation Verification Technologies
Panel: Applying the New Breed of Automotive Specific, Next-Generation Verification Technologies Moderator: Paul Dempsey – Tech Design Forum
Presented at: DVCon Europe 2019, 30 October 2021
Panelists:
* Jamil Mazzawi – Optima Design Automation; * Bill Bunton – Intel Corp.; * Dr. Ashish Darbari – Axiomise Ltd.; * Dave Kelf – Breker Verification Systems, Inc.; * Ralf Gorgen – NXP Semiconductor
ISO-26262 and Avoiding Hard and Soft Errors in Automotive IC
The safety-critical semiconductor products used in the Automotive Industry have to be safe from damages caused by random HW faults, both permanent and transitory, meeting the ISO-26262 standard. Here we review the main Design for Safety mechanisms that can be used to ensure design safety, discuss their relative merits, and focus on the validation (e.g., fault simulation) required to ensure the selected mechanisms have been used correctly.
Presented at: ChipEx 2017, Tel Aviv
By: Amir Rahat, former Optima VP of R&D
Optima Tools Presentation and Demo
In October 2017, Optima hosted the ISO-26262 SOTIF standard community meeting (ISO-26262 PT Meeting ISO PAS 21448) at its headquarters in Nazareth. This video includes a demo and presentation about Optima’s tools and solutions.
Presented at: ISO-26262 SOTIF meeting, Nazareth 2017
By the Optima team: Amir Rahat, Ayman Mouallem, and Deeb Kattoura
Design Reliability 2.0: Safety is Everything
The world of HW & SW engineering is continually reinventing itself. This time it is about safety. As computers move out of the virtual world and begin participating in the real world (driving cars, controlling plants, controlling cities and traffic jams, etc.), the demands for safety grow dramatically. What is needed is Trustworthiness, defined as the sum of Safety, Reliability, Availability, Resilience, and Security.
Presented at: Haifa Verification Conference (HVC) 2016
By: Amir Rahat, former Optima VP of R&D
Self-Driving Cars and Their Influence on the Automotive Semiconductor Industry
An introduction to ISO-26262 and Functional-Safety for Semiconduction Chips
Presented at: ChipEx 2016, Tel Aviv
By: Jamil Mazzawi, Optima Founder and CEO
Introduction to Soft Error Mitigation Using Selective Hardening, Part 1
Presented at: ChipEx 2014, Tel Aviv
By: Jamil Mazzawi, Optima Founder and CEO
Introduction to Soft Error Mitigation Using Selective Hardening, Part 2
Presented at: ChipEx 2014, Tel Aviv
By: Jamil Mazzawi, Optima Founder and CEO