At STMicroelectronics / Imaging, we used Optima’s soft-error solution to analyze failure mechanisms in our internal CPU for an ASIL-B automotive imagers. OSP enabled us to understand whether transient faults persist or clear within the CPU during activity and inactivity periods and how they can be reactivated. Optima’s solution was instrumental in this analysis due to its superior execution speed, making it the most effective tool for transient fault analysis. The results enabled us to refine our FMEDA beyond the capabilities of previous tools and to avoid over-design, saving us time and money.
Mathieu Thivin
Head of digital architecture & senior FuSa architect
Imaging sub-group, STMicrotelectronics
Jamil Mazzawi has over 25 years’ experience in the semiconductor and EDA industries across Silicon Valley, Israel, and Europe. He has held engineering, sales, and managerial positions at Ornet Data Communication, Verisity, Rambus, Sun Microsystems, Jasper Design Automation, and now Optima. With a successful track record developing, promoting, and selling disruptive technologies that include advanced verification solutions and leading automotive development products, Jamil authored seven patents in related fields.
This project has received funding from the European Union’s Horizon 2020 research and innovation programme under grant agreement No. 850104.