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Habib Karam
Operations Manager
Tel :+97246194603
habib@optima-da.com
Recent Posts
Media Advisory: Optima to Participate at DVCon US 2021
Media Advisory: Optima’s Participation at DVCon Europe 2020
Media Advisory: Optima’s DVCon U.S. Participation
Optima Design Automation Launches with Focus on Next-Generation Semiconductor Functional Safety Tools
Optima Design Automation geht mit Tools für die nächste Halbleitergeneration mit Fokus auf Functional Safety an den Start
Optima Design Automation
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Media Advisory: Optima to Participate at DVCon US 2021
/in Press Releases /by Anastasiya SasnakevichThe Design and Verification Conference (DVCon) has gained it’s popularity in its niche as one of the top conferences for the application of languages, tools, and intellectual property for the design and verification of electronic systems and integrated circuits. DVCon US brings chip architects, systems designers, software developers, and IP integrators the latest methodologies, techniques, applications, and demonstrations on the practical use of EDA and IP languages and standards used in electronic design.
Caused by Covid-19 all the conferences have been switched to online mode for over a year, and DVCon US’21 is not an exception. This year’s conference is to held virtually and as a participant, Optima is conducting a workshop.
Workshop: Achieving ISO 26262 ASIL Metrics Using Modern Static And Dynamic Failure Mode Fault Analysis Read more
Media Advisory: Optima’s Participation at DVCon Europe 2020
/in Press Releases /by Habib KaramThe Design and Verification Conference (DVCon) is the premier conference for the application of languages, tools, and intellectual property for the design and verification of electronic systems and integrated circuits. Sponsored by Accellera Systems Initiative, DVCon Europe brings chip architects, systems designers, software developers, and IP integrators the latest methodologies, techniques, applications, and demonstrations on the practical use of EDA and IP languages and standards used in electronic design.
Due to Covid-19 and travel restrictions, this year’s DVCon Europe will hold a virtual conference and as a participant, Optima will be conducting life, virtual demos. You can join us at our virtual exhibition room/booth.
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Media Advisory: Optima’s DVCon U.S. Participation
/in Press Releases /by Habib KaramWHO
Optima Design automation, a pioneer in Functional Safety and ISO 26262 fault analysis technology targeting hard and soft error analysis for accelerated semiconductor development of up to 1,000X performance improvement over traditional fault simulation for automotive and other safety critical applications
WHAT
Due to travel restrictions associated with the Coronavirus, Optima’s team to DVCon was not able to attend DVCon in person. Instead, Optima will be conducting live, virtual demos from their Booth #406 at DVCon. Attendees are invited to stop by during show hours to meet with Optima’s CEO Jamil Mazzawi for a one on one conversation about specific Functional Safety and ISO-26262 design challenges or a quick demonstration of the company’s next generation functional safety products.
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Optima Design Automation Launches with Focus on Next-Generation Semiconductor Functional Safety Tools
/in Press Releases /by Becky RaymondRevolutionary, High-Performance Optima Safety Platform Propels Range of High-Coverage Safety Solutions for Automotive ISO 26262 Fault Analysis
NAZARETH, ISRAEL – October 29, 2019 – Optima Design Automation a provider of advanced, unique semiconductor safety verification solutions based on a revolutionary, new fault analysis technology platform, launched today at the DVCon Europe event in Munich. Optima enables dramatic improvements in semiconductor safety verification time and coverage for safety-critical applications such as automotive semiconductor devices.
Optima also announced the commercial release of its Optima Safety Platform with an initial range of automated solutions for hard-error (permanent) and soft-error (transient) fault analysis, coverage maximization and static analysis. Based on 27 person-years of development, the Optima Safety Platform is already in evaluation at leading automotive semiconductor providers.
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Optima Design Automation geht mit Tools für die nächste Halbleitergeneration mit Fokus auf Functional Safety an den Start
/in Press Releases /by Becky RaymondRevolutionäre, leistungsstarke Sicherheitsplattform von Optima erweitert das Angebot an hochabdeckenden Sicherheitslösungen für die Fehleranalyse gemäß ISO 26262
NAZARETH, ISRAEL – 29. Oktober 2019– Optima Design Automation präsentiert sich erstmals als Aussteller auf der DVCon Europe in München. Das Unternehmen ist Anbieter fortschrittlicher, einzigartiger Lösungen für die Verifikation der funktionalen Sicherheit von Halbleitern. Grundlage der innovativen Lösungen ist eine revolutionäre Fehleranalysetechnikplattform. Mit deren Hilfe lässt sich sowohl der Zeitaufwand für die Verifikation der funktionalen Sicherheit erheblich reduzieren als auch der Umfang der Fehlerabdeckung deutlich steigern. Optima hat dabei besonders sicherheitskritische Anwendungen wie Automotive-Halbleiter im Blick.
Optima kündigt anlässlich der DVCon die Markteinführung der Optima Safety Platform an, die mit automatisierten Lösungen an den Start geht, mit denen sich permanente (Hard-Error) und transiente (Soft-Error) Fehler analysieren, die Abdeckung maximieren sowie strukturelle Analysen durchführen lassen. Die Optima Safety Platform, in der mehr als 27 Mannjahre Entwicklungszeit stecken, befindet sich bereits bei führenden Anbietern von Automotive-Halbleitern in der Evaluierung.
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Optima Design Automation Announces the “Optima Safety Platform” to Drive Order-of-Magnitude Safety Fault Analysis Performance Improvements
/in Press Releases /by Becky RaymondFault Injection Engine Forms the Basis of Unique Hard and Soft Error Automated Fault Analysis Solutions Accelerating ISO 26262 Verification and Increasing Device Quality
NAZARETH, ISRAEL – October 29, 2019 – Optima Design Automation today rolled out its next-generation Optima Safety Platform, (OSP), based on its Fault Injection Engine (FIE™) technology. OSP includes Optima’s first two automated solutions: Optima-HE™ and Optima-SE™ for hard-error and soft-error analysis, respectively. By increasing fault analysis performance by orders of magnitude over the next fastest solution, Optima offers its customers a reduction in analysis time from months to days, as well as automated coverage improvement and design safety.
OSP has been shown in private benchmarks to increase fault analysis performance more than two orders of magnitude over its nearest rival. To date, fault analysis of large automotive safety critical devices, as stipulated by the ISO 26262 standard, can require months of compute time to perform. By reducing this time to a matter of days or hours, new forms of analysis can be performed that dramatically improve device safety and quality while ensuring an accurate measure of fault resistance. The addition of Optima’s automated CoverageMaximizer™ technology allows for design areas not analyzed during verification to be easily eliminated, further improving the analysis process.
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Optima Safety Platform von Opima Design Automation ermöglicht Performance-Quantensprung bei der Safety-Fehleranalyse
/in Press Releases /by Becky RaymondNeue Fault Injection Engine bildet das Fundament für einzigartige Lösungen zur automatisierten Analyse von permanenten sowie transienten Fehlern. Damit lässt sich die von der ISO 26262 geforderte Verifikation beschleunigen und die Gerätequalität erhöhen.
NAZARETH, ISRAEL –29. Oktober 2019 – Optima Design Automation hat heute die Optima Safety Platform (OSP) vorgestellt, die auf der Fault Injection Engine (FIE) des Unternehmens basiert. OSP ist eine Fehleranalyselösung der nächsten Generation und umfasst aktuell zwei automatisierte Werkzeug von Optima: Optima-HE für die Analyse von permanenten (Hard-Error) und Optima-SE für die Analyse von transienten (Soft-Error) Fehlern. Das Unternehmen ermöglicht seinen Anwendern gegenüber den heute schnellsten Lösungen eine Steigerung der Fehleranalyseleistung um Größenordnungen. Dadurch verkürzt sich die Analysezeit von Monaten auf Tage. Gleichzeitig kann eine höhere Abdeckung und Designsicherheit erreicht werden.
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